Yield-based capability index for evaluating the performance of multivariate manufacturing process
Gu Kai Jia Xinzhang Liu Hong-Wei You Hailong · 2015
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期刊名称:
Quality and Reliability Engineering International   2015 年 31 卷 3 期
发表日期:
2015.04.01
摘要:
Process capability indices (PCIs) have been widely used in the manufacturing industry providing numerical measures on process precision, accuracy and performance. Capability indices measures for processes with a single characteristic have been investigated extensively. However, an industrial product may have more than one quality characteristic. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, multivariate PCIs should be introduced. In this paper, we analyze the relationship between PCI and process yield. The PCI EC
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