Optical properties of InN studied by spectroscopic ellipsometry

叶春芽林伟周瑾李书平陈荔李恒吴小璇刘松青康俊勇 · 2016

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InN

spectroscopic ellipsometry

refractive index

extinction coefficient

期刊名称：

Journal of Semiconductors 2016 年 10 期

摘要：

With recently developed In N epitaxy via a controlling In bilayer, spectroscopic ellipsometry(SE) measurements had been carried out on the grown In N and the measured ellipsometric spectra were fitted with the Delta Psi2 software by using a suitable mo...